New XRF Elemental Analysis Equipment

Used for ROHS/Lead-Free Testing, Non-Destructive Gold / Precious Metal Assay

Environmental, RoHS & WEEE:

  • XRF Technology demonstration for testing of contaminants in soil samples visit: Characterization and Monitoring - XRF Demonstration
  • RoHS & WEEE compliance testing for Lead, Mercury, Cadnium, Hexavalent Chromium, Polybrominated Biphenyls and Polybrominated Diphenyl Ethers

Jewelry Assay:

  • Non-destructive analysis of precious metal alloys including Gold, Silver and Platinum
  • Fast analysis of all elements with or without standards
  • Mapping programs help locate problem and non-homogeneous areas
  • Thickness analysis on plated jewelry

Metal alloy analysis:

  • Analysis of alloy samples including contaminants and non-homogenous areas
  • Fast, non-destructive test with or without standards

Liquid Analysis:

  • Plating bath solution analysis
  • Waste water analysis

Electronics Industry:

  • Thickness and alloy compositional analysis
  • Thin film analysis - single, double and triple layer analysis

Scrap:

  • Identification of heavy metals
  • Precious metals analysis

ElvaX Mini

  • ElvaX Mini is a compact Energy-Dispersive X-Ray Fluorescence(EDXRF) spectrometer ideally suited for qualitative and quantitative analysis of metal alloys and other solids, liquids and powders.
  • Applications include RoHS & WEEE testing, precious and non-precious metal assay, environmental testing, etc.
  • All the software features of the ElvaX & ElvaX Light
    Non-destructive elemental analysis of precious and non-precious metals, liquids and powders
  • Solid state Si-pin detector produces high resolution without the need for liquid Nitrogen with a detection range of Ti(22)-Pu(94), Detector resolution is 200 eV at 5.9 keV (Mn Ka line)
  • Accurate to <0.3% for metal alloys, detection threshold below 1 ppm for most elements
  • Simple single screen operation
    30% lower price than the ElvaX system
  • Call for Pricing

ElvaX

  • For testing of material in compliance with RoHS & WEEE Directives
  • State of the art desktop x-ray fluorescent analyzer
  • Non-destructive elemental analysis of precious and non-precious metals, liquids and powders
  • Solid state Si-pin detector produces high resolution without the need for liquid Nitrogen with a detection range of Cl(17)-Pu(94), Detector resolution is 185 eV at 5.9 keV (Mn Ka line)
  • Accurate to <0.3% for metal alloys, detection threshold below 1 ppm for most elements
  • Windows 98, 2k, Me, XP compatible
  • Simple single screen operation
  • Cost is a fraction of most comparable systems
  • ElvaX-Light, capable of measuring down to Na(11), does not require operation under vacuum (He Purge System)
  • Available with 8 position multiple sample carousel
  • Call for Pricing